Hello malcolmlewis (sorry again for the delays …)
If I used smartctl to check the disk, and the test ‘Extended offline’ and ‘Short offline’ end without errors.
The values of ‘Raw_Read_Error_Rate’ changed from 95 to 100 (up and down) y Seek_Time_Performance
changes between 138 to 144 (up and down)
In the crash described in this post seems to overlap with the error happened ‘Raw_Read_Error_Rate’, but it seems not to be associated. The night after the first crash, smartd valors showed changes in Seek_Time_Performance and Raw_Read_Error_Rate 25min before. Also I have to change these values at a time when the backup is being performed and computer are not a crash happens
the computer (is a deskop PC) not doing any task entities start backup. During backup disk does not seem to be overstretched. During poceso lasts 4 hours, has an average of 5MB / s, 4 peaks 88MB / s (the disk is capable of reaching values of 115MB / s).
Change the disc last night and a few minutes ago to SLES 11 SP2 upgrade and wait …
I copy the log smartctl if there’s something I do not see …
Thanks for always being lleyendo and answering my post 
[CODE]
soporte1:~ # smartctl -a /dev/sda
smartctl 5.39 2008-10-24 22:33 [x86_64-suse-linux-gnu] (openSUSE RPM)
Copyright (C) 2002-8 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: Hitachi HDS721010CLA332
Serial Number: JP2940HD0P7D3C
Firmware Version: JP4OA3EA
User Capacity: 1,000,204,886,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Mon Jan 7 08:48:15 2013 ART
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (10576) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 176) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 099 099 016 Pre-fail Always - 131072
2 Throughput_Performance 0x0005 133 133 054 Pre-fail Offline - 105
3 Spin_Up_Time 0x0007 125 125 024 Pre-fail Always - 305 (Average 301)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 359
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 140 140 020 Pre-fail Offline - 30
9 Power_On_Hours 0x0012 098 098 000 Old_age Always - 17203
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 359
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 369
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 369
194 Temperature_Celsius 0x0002 139 139 000 Old_age Always - 43 (Lifetime Min/Max 16/55)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 47
SMART Error Log Version: 1
ATA Error Count: 43 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It “wraps” after 49.710 days.
Error 43 occurred at disk power-on lifetime: 7736 hours (322 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 51 30 01 37 1e 08 Error: ICRC, ABRT 48 sectors at LBA = 0x081e3701 = 136197889
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
35 00 80 b1 36 1e e8 08 28d+21:17:59.357 WRITE DMA EXT
35 00 10 71 ea c3 e4 08 28d+21:17:59.355 WRITE DMA EXT
35 00 80 f1 e9 c3 e4 08 28d+21:17:59.353 WRITE DMA EXT
25 00 80 39 9f 08 ea 08 28d+21:17:59.351 READ DMA EXT
25 00 10 7f 1a c3 e0 08 28d+21:17:59.252 READ DMA EXT
Error 42 occurred at disk power-on lifetime: 7736 hours (322 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 51 40 29 98 db 0b Error: ICRC, ABRT 64 sectors at LBA = 0x0bdb9829 = 198940713
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
35 00 80 e9 97 db eb 08 28d+21:00:46.299 WRITE DMA EXT
35 00 80 69 97 db eb 08 28d+21:00:46.297 WRITE DMA EXT
25 00 08 21 61 4c e7 08 28d+21:00:46.293 READ DMA EXT
25 00 08 19 61 4c e0 08 28d+21:00:46.185 READ DMA EXT
25 00 80 f1 9f 32 e5 08 28d+21:00:46.164 READ DMA EXT
sucedio 17203 - 7736 = 9467(394,458333333 Dias)
Error 41 occurred at disk power-on lifetime: 7736 hours (322 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 51 70 c1 4e f2 09 Error: ICRC, ABRT 112 sectors at LBA = 0x09f24ec1 = 166874817
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
35 00 80 b1 4e f2 e9 08 28d+20:33:37.532 WRITE DMA EXT
35 00 80 31 4e f2 e9 08 28d+20:33:37.530 WRITE DMA EXT
35 00 70 c1 4d f2 e9 08 28d+20:33:37.525 WRITE DMA EXT
25 00 08 09 92 4c e0 08 28d+20:33:37.444 READ DMA EXT
25 00 80 c1 b9 17 ec 08 28d+20:33:37.429 READ DMA EXT
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 51 01 c0 9b ab 0d Error: ICRC, ABRT 1 sectors at LBA = 0x0dab9bc0 = 229350336
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
35 00 80 41 9b ab ed 08 28d+19:35:09.989 WRITE DMA EXT
25 00 08 e1 d3 57 eb 08 28d+19:35:09.988 READ DMA EXT
35 00 08 59 1e 4a e7 08 28d+19:35:09.986 WRITE DMA EXT
25 00 80 21 77 31 eb 08 28d+19:35:09.985 READ DMA EXT
35 00 80 c1 9a ab ed 08 28d+19:35:09.983 WRITE DMA EXT
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 51 08 d9 d8 69 04 Error: ICRC, ABRT 8 sectors at LBA = 0x0469d8d9 = 74045657
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
35 00 28 b9 d8 69 e4 08 28d+19:32:06.394 WRITE DMA EXT
25 00 80 f9 26 8c e5 08 28d+19:32:06.392 READ DMA EXT
35 00 80 39 d8 69 e4 08 28d+19:32:06.390 WRITE DMA EXT
25 00 80 79 26 8c e5 08 28d+19:32:06.388 READ DMA EXT
35 00 80 81 ee 3f ed 08 28d+19:32:06.370 WRITE DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
[/CODE]Note: You have no values ’self-test’, because it generates the text before the test, but has the same values as the current.